Saturday, March 2, 2019

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New X-ray measurement approach could improve CT scanners

(National Institute of Standards and Technology (NIST)) A new measurement approach proposed by NIST scientists could lead to a better way to calibrate computed tomography (CT) scanners, potentially streamlining patient treatment by improving communication among doctors.

from EurekAlert! - Technology, Engineering and Computer Science https://ift.tt/2Env2vZ

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